Effect of Mg Ionization Efficiency on Heterojunction Bipolar Transistors
نویسنده
چکیده
A drift-diffusion transport model has been used to examine the performance capabilities of AIGaN/GaN Npn heterojunction bipolar transistors (HBTs). The Gumrnel plot from the first GaN-based HBT structure recently demonstrated is adjusted with simulation by using experimental mobility and lifetime reported in the literature. Numerical results have been explored to study the effect of the p-type Mg doping and its incomplete ionization in the base. The high base resistance induced by the deep acceptor level is found to be the cause of limiting current gain values. Increasing the operating temperature of the device activates more carriers in the base. An improvement of the simulated current gain by a factor of 2 to 4 between 25 and 300”C agrees well with the reported experimental results. A preliminary analysis of high frequency characteristics indicates substantial progress of predicted rf performances by operating the device at higher temperature due to a reduced extrinsic base resistivity. PACS Numbers: 85.30.Pq, 85.30.De, 61.72.V, 72.80.E C. Monier et al. I Applied Physics Letters 1 DISCLAIMER This report was prepared as an account of work sponsored byanagency of the United States Government. Neither the United States Government nor any agency thereof, nor any of their employees, make any warranty, express or implied, or assumes any legal liability or responsibility for the accuracy, completeness, or usefulness ,of any information, apparatus, product, or process disclosed, or represents that its use would not infringe privately owned rights. Reference herein to any specific commercial product, process, or service by trade name, trademark, manufacturer, or otherwise does not necessarily constitute or imply its endorsement, recommendation, or favoring by the United States Government or any agency thereof. The views and opinions of authors expressed herein do not necessarily state or reflect those of the United States Government or any agency thereof.
منابع مشابه
Unipolar and bipolar operation of InAs/InSb nanowire heterostructure field-effect transistors
We present temperature dependent electrical measurements on n-type InAs/InSb nanowire heterostructure field-effect transistors. The barrier height of the heterostructure junction is determined to be 220 meV, indicating a broken bandgap alignment. A clear asymmetry is observed when applying a bias to either the InAs or the InSb side of the junction. Impact ionization and band-to-band tunneling i...
متن کاملNovel Transient Phenomena in Heterojunction Bipolar Transistors
The interaction between transferred-electron effect and base widening under transient conditions in III-V heterojunction bipolar transistors is considered. Modification of the collector field profile with an n+ doping spike is shown to cause a time delay for the onset of Kirk effect creating conditions for the inception of charge instabilities. Numerical simulations suggest the possibility of s...
متن کاملAnalysis of Kirk Effect in Nanoscale Quantum Well Heterojunction Bipolar Transistor Laser
In this paper, we present an analytical model to analysis the kirk effect onstatic and dynamic responses of quantum well heterojunction bipolar transistor lasers(HBTLs). Our analysis is based on solving the kirk current equation, continuityequation and rate equations of HBTL. We compare the performance (current gain,output photon number and small signal modulation bandwi...
متن کاملTransferred-electron induced current instabilities in heterojunction bipolar transistors
Current driven instabilities in the collector of III–V heterojunction bipolar transistors ~HBT! are investigated. Numerical simulations indicate that in a modified AlGaAs/GaAs HBT the collector current shows oscillatory behavior due to the transferred-electron ~Gunn–Hilsum! effect. Influence of the Kirk effect as well as conditions for oscillation are discussed. © 1995 American Institute of Phy...
متن کامل